On the 30th March, Robert Hillinger and Jim Macy of Kistler will hold a webinar to talk about semiconductors and how to improve production efficiency and quality with dynamic force measurement.
On the 30th March at 4pm, a webinar organised by Kistler will take place, where two Kistler experts will talk about semiconductors and how to improve production efficiency and quality with dynamic force measurement. The speakers will be Robert Hillinger, Business Development Manager, and Jim Macy, Application Expert, both from Kistler, and they will demonstrate how force measurement solutions by Kistler allow to monitor mechanical stress during the production process and reduce ppm rejection rate as well as increase machine performance and speed accuracy.
Master the manufacturing challenges
New applications like AI, 5G or IoT have increased the demands on the performance of semiconductors. This also poses new challenges for production as the importance of quality inspection and process monitoring increases. The participants will find out how the Kistler portfolio can enable them to master the manufacturing challenges ahead while benefiting from higher process visibility, lower quality cost and traceability of process data.
For registration, click here: https://www.globalspec.com/events/eventdetails?eventId=3333